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66篇 您的检索式：作者名="Schwider"

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	题名	作者	年代	出处	被引量
1	Homogeneity testing by phase sampling interferometry 显示文摘	Schwider J Burow R Elssner K E	1985	Applied Opties(S1559-128X)1985，24，18：	1
2	New compensating four-phase algorithm for phase-shift interferometry 显示文摘	Schwider J Falkenstoerfer O Schreiber H	1993	Optical Eng1993，32，8：	1
3	New compensating four phase algorithm for phase-shift interferometry显示文摘	Schwider J Falkenstorfer O Schreiber H	1993	Opt Eng1993，32，8：	1
4	New compensating four-phase algorithm for phase-shifting interferometry显示文摘	J Schwider O Falkensttorfer H Schreiber	1993	Opt Eng1993，32，8：	1
5	Some considerations of reduction of reference phase error in phase-stepping interferometry显示文摘	Schwider J Dresel T Manzke t:	1999	Applied Optics1999，38，4：	1
6	Digital wave-front measuring interferometry:some systematic error sources显示文摘	SCHWIDER J	1983	Applied Optics1983，22，：	1
7	Precise measurement of planness 显示文摘	SCHULZ G SCHWIDER J	1967	Applied Optics1967，6，10：	1
8	Precise measurement of planeness显示文摘	Schulz G Schwider J	1967	Appl Opt1967，6，6：	1
9	Establishing an optical flatness显示文摘	Sehulz G Schwider J	1971	Appl Opt1971，10，4：	1
10	Digital wavefront measuring interferometry:some systematic error sources显示文摘	SCHWIDER J BUROW R KLSSNER K E	1983	Appl Opt1983，22，21：	1
11	Digital wave-front measuring interferometry: some systematic error sources 显示文摘	Schwider J Burow R	1983	Appl Opt1983，22，21：	1
12	Red-green-blue interferometer for the metrology of discontinuous structures显示文摘	Andreas Pft~rtner Johannes Schwider	2003	Appl Opt2003，42，4：	1
13	Three channel phase-shifting interferometer using polarization-optics and a diffraction grating显示文摘	A Hettwer J Kran J Schwider	2000	Optical Engineering2000，39，4：	1
14	Absolute testing of the reference surface of a Fizeau interferometer through even/odd decompositions 显示文摘	SCHREINER R SCHWIDER J LINDLEIN N	2008	Applied Optics2008，47，32：	1
15	Dispersive interferometric profilometer显示文摘	SCHWIDER J ZHOU Liang	1994	Optics Letters1994，19，13：	1
16	Microlenses fabricated by melting photoresist on a base layer显示文摘	Haselbeck S Schrelber H Schwider J	1993	Opt Engng1993，32，6：	1
17	Digital wave - front measuring interferometry- some systematic error source 显示文摘	Schwider J Burow J J	1983	ApplOpt1983，22，21：	1
18	Waveffont characterization with a miniaturized Shack-Hartmann Sensor显示文摘	DU Chun-lei Zurl K Schwider J	1996	Optik (S0030-4026)1996，101，4：	1
19	Precise measurement of planness显示文摘	Schulz G Schwider J	1967	Applied optics1967，6，6：	1
20	Superposition fringes for profiling applications显示文摘	J Schwider	2007	Proceeding of SPIE Optical Measurement Systems for Industrial Inspection Ⅴ2007，6616，：	1

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