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Post-annealing effect on the structural and mechanical properties of multiphase zirconia films deposited by a plasma focus device

查看全文 作  者:[1]I.A.Khan;[2]R.S.Rawat;[3]R.Ahmad;[1]M.A.K.Shahid 高影响力作者 机构地区:[1]Department of Physics, Government College University;[2]National Institute of Education, Nanyang Technological University;[3]Department of Physics, GC University高影响力机构 出  处:《Chinese Physics B》索引2013年第22卷第12期,共9页高影响力期刊 基  金:Project supported by the Higher Education Commission of Pakistan 摘  要:Nanostructured multiphase zirconia films(MZFs) are deposited on Zr substrate by the irradiation of energetic oxygen ions emanated from a plasma focus device. The oxygen operating gas pressure of 1 mbar(1 bar = 105Pa) provides the most appropriate ion energy flux to deposit crystalline ZrO2 films. X-ray diffraction(XRD) patterns reveal the formation of polycrystalline ZrO2 films. The crystallite size(CS), crystal growth, and dislocation densities are attributed to increasing focus shots, sample axial distances, and working gas pressures. Phase and orientation transformations from t-ZrO2 to m-ZrO2 and c-ZrO2 are associated with increasing focus shots and continuous annealing. For lower(200 C) annealing temperature(AT), full width at half maximum(FWHM) of diffraction peak, CS, and dislocation density(δ) for(020) plane are found to be 0.494, 16.6 nm, and 3.63 × 10 3nm 2while for higher(400 C) AT, these parameters for(111) plane are found to be 0.388, 20.87 nm, and 2.29 × 10 3nm 2, respectively. Scanning electron microscope(SEM) results demonstrate the formation of rounded grains with uniform distribution. The estimated values of atomic ratio(O/Zr) in ZrO2 films deposited for different axial distances(6 cm, 9 cm, and 12 cm) are found to be 2.1, 2.2, and 2.3, respectively. Fourier transform infrared(FTIR) analysis reveals that the bands appearing at 441 cm-1 and 480 cm-1 belong to m-ZrO2 and t-ZrO2 phases, respectively. Maximum microhardness(8.65 ± 0.45 GPa) of ZrO2 film is ~ 6.7 times higher than the microhardness of virgin Zr. 关 键 词:二氧化锆薄膜 等离子体聚焦 连续退火 沉积 机械性能 装置 多相 纳米氧化锆
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