Density Profile and Fluctuation Measurements by Microwave Reflectometry on EAST

查看全文 作　　者：[1]张寿彪;[1]高翔;[1]凌必利;[1]王嵎民;[1]张涛;[1]韩翔;[1]刘子奚;[1]布景亮;[1]李建刚;EAST [1]team

机构地区：[1]Institute of Plasma Physics,Chinese Academy of Sciences

出　　处：《Plasma Science and Technology》索引2014年第16卷第4期,共5页

基　　金：supported by National Natural Science Foundation of China(Nos.11305208 and 11275234);the National Magnetic Confinement Fusion Program of China(Nos.2014GB106000 and 2014GB106003) 摘　　要：A microwave reflectometry system operating in the V-band frequency with extraordinary mode polarization has been developed on the EAST tokamak.The reflectometry system,using a voltage-controlled oscillator(VCO) source driven by an arbitrary waveform generator with high temporal resolution,can operate for the density profile measurement.The result of the bench test shows that the output frequency of the VCO has a linear dependence on time.The dispersion of reflectometry system is determined and reported in this paper.The evolution of a pedestal density profile during the L-H transition is observed by the reflectometry in H-mode discharges on EAST tokamak.A frequency synthesizer is used to replace the VCO as microwave source for density fluctuation measurements.The level of density fluctuation in the pedestal shows an abrupt decrease when the plasma enters into H-mode.A coherent mode with a frequency of about100 kHz is observed and the mode frequency decreases gradually as the pedestal evolves. 关键词：密度分布微波反射测量波动 EAST装置高时间分辨率任意波形发生器 H模式放电

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Density Profile and Fluctuation Measurements by Microwave Reflectometry on EAST

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