Microstructural Study of Zinc Sulfide Thin Films

查看全文 作　　者：CHEN Mouzhi,LIU Zhaohong,WANG YujiangWANG Hui,DENG Chonghui(Xiamen University,Xiamen 361005,CHN)Absrtact: The radio frequency magnetron sputtering (RFMS) technique is employed for preparing ZnS:Er electroluminescent films,and the information about surface states and internal bulk structure of the prepared films are obtained by using X-ray diffraction and X-ray photoelectron spectroscopy techniques.The results reveal the microstructure and phase-transition characteristics of the films and provide the reference for seeking new material with high-brightness.  出　　处：《Semiconductor Photonics and Technology》索引1997年第3卷第3期,共5页 摘　　要：MicrostructuralStudyofZincSulfideThinFilms①②CHENMouzhi,LIUZhaohong,WANGYujiangWANGHui,DENGChonghui(XiamenUniversity,Xiamen361... 关 键 词：微结构 硫化锌 微晶薄片 半导体