3D Multi-gate Transistors: Concept, Operation, and Fabrication

查看全文 作　　者：Nader [1,2]Shehata;Abdel-Rahman [3]Gaber;Ahmed [3]Naguib;Ayman E. [4]Selmy;Hossam [3]Hassan;Ibrahim [3]Shoeer;Omar [3]Ahmadien;Rewan [3]Nabeel 机构地区：[1]Department of Engineering Mathematics and Physics, Faculty of Engineering, Alexandria University, Alexandria 21544, Egypt;[2]CSNP (Center of Smart Nanotechnology and Photonics), Smart CI Research Center, Alexandria University, Alexandria 21544,Egypt;[3]Department of Electrical Engineering, Faculty of Engineering, Alexandria University, Alexandria 21544, Egypt;[4]School of Sciences and Engineering, the American University in Cairo, P.O. Box 74 New Cairo 11835, Egypt 出　　处：《Journal of Electrical Engineering》索引2015年第3卷第1期,共14页 关 键 词：电气工程 电气测试 集中参数 频率