Imaging Electronic Structure of Carbon Nanotubes by Voltage-Contrast Scanning Electron Microscopy

查看全文 作　　者：Aravind [1]Vijayaraghavan;Sabine [1,2]Blatt;Christoph [1,2]Marquardt;Simone [1]Dehm;Raghav [1]Wahi;Frank [1]Hennrich;Ralph [1]Krupke

机构地区：[1]Institut für Nanotechnologie,Forschungszentrum Karlsruhe,D-76344 Eggenstein-Leopoldshafen,Germany;[2]Physikalisches Institut,Universität Karlsruhe,D-76021 Karlsruhe,Germany

出　　处：《Nano Research》索引2008年第1卷第4期,共12页

基　　金：The research was funded by the Initiative and Networking Fund of the Helmholtz Gemeinschaft Deutscher Forschungszentren and equipment grant from Agilent Technologies. 摘　　要：We introduce voltage-contrast scanning electron microscopy(VC-SEM)for visual characterization of the electronic properties of single-walled carbon nanotubes.VC-SEM involves tuning the electronic band structure and imaging the potential profi le along the length of the nanotube.The resultant secondary electron contrast allows to distinguish between metallic and semiconducting carbon nanotubes and to follow the switching of semiconducting nanotube devices,as confi rmed by in situ electrical transport measurements.We demonstrate that high-density arrays of individual nanotube devices can be rapidly and simultaneously characterized.A leakage current model in combination with fi nite element simulations of the device electrostatics is presented in order to explain the observed contrast evolution of the nanotube and surface electrodes.This work serves to fi ll a void in electronic characterization of molecular device architectures. 关键词：Carbon nanotubes electronic properties voltage-contrast scanning electron microscopy ELECTROSTATICS

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Imaging Electronic Structure of Carbon Nanotubes by Voltage-Contrast Scanning Electron Microscopy

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