Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis

查看全文 作　　者：Wei-Tao [1,3]Yang;Xue-Cheng [1,4]Du;Yong-Hong [1]Li;Chao-Hui [1]He;Gang [2]Guo;Shu-Ting [2]Shi;Li [2]Cai;Sarah [3]Azimi;Corrado De [3]Sio;Luca [3]Sterpone

机构地区：[1]School of Nuclear Science and Technology,Xi’an Jiaotong University,Xi’an 710049,China;[2]National Innovation Center of Radiation Application,China Institute of Atomic Energy,Beijing 102413,China;[3]Dipartimento Di Automatica E Informatica,Politecnico di Torino,10129 Torino,Italy;[4]School of Nuclear Science and Technology,University of South China,Hengyang 421001,China

出　　处：《Nuclear Science and Techniques》索引2021年第32卷第10期,共10页

基　　金：This work was supported by the National Natural Science Foundation of China(Nos.11575138,11835006,11690040,11690043,and 11705216);the Innovation Center of Radiation Application(No.KFZC2019050321);the China Scholarships Council program(No.201906280343). 摘　　要：The propagation of single-event effects(SEEs)on a Xilinx Zynq-7000 system on chip(SoC)was inves-tigated using heavy-ion microbeam radiation.The irradia-tion results reveal several functional blocks’sensitivity locations and cross sections,for instance,the arithmetic logic unit,register,D-cache,and peripheral,while irradi-ating the on-chip memory(OCM)region.Moreover,event tree analysis was executed based on the obtained microbeam irradiation results.This study quantitatively assesses the probabilities of SEE propagation from the OCM to other blocks in the SoC. 关键词：System on chip Single-event effect Heavy-ion microbeam Event tree analysis

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Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis

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