维普期刊资源整合服务平台（V6.5）

111篇 您的检索式：期刊名="Journal of Electronic Testing"

选中清除导出查看参考文献查看引证文献引用追踪共6页首页上一页第1页下一页末页 /6 跳转

	题名	作者	年代	出处	被引量
1	CEP: cor- related error propagation for hierarchical soft error analy- sis显示文摘	CHEN L EBRAHIMI M TAHOORI M B	2013	Journal of Electronic Testing2013，1，1：	1
2	Scalability of globally asynchronous QCA (quantum-dot cellular automata) adder design 显示文摘	MINSU C MYUNGSU C	2008	Journal of Electronic Testing2008，24，123：	1
3	An automotive CD-player electro-mechanics fault simulation using VHDL-AMS显示文摘	GRAZIANO M ROCH M R R	2008	Journal of Electronic Testing2008，，6：	1
4	Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter显示文摘	Y. Ren L. Fan L. Chen S.-J. Wen R. Wong N. W. Vonno A. F. Witulski B. L. Bhuva	2012	Journal of Electronic Testing2012，，6：	1
5	A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard显示文摘	Natale G D Doulcier M Flottes M L	2009	Journal of Electronic Testing2009，25，45：	1
6	A new algorithm for the selection of control cells in boundary-scan interconnect test显示文摘	Quiros-Olozabal A Cifredo-CHacon M A	2009	Journal of Electronic Testing2009，25，2：	1
7	Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip显示文摘	Vikram Iyengar Krishnendu Chakrabarty Erik Jan Marinissen	2002	Journal of Electronic Testing2002，，2：	1
8	Evaluating the effectiveness of a software based technique under SEEs using FPGA based fault injection approach 显示文摘	PORTELA G M LINDOSO A ENTRENA L	2012	Journal of Electronic Testing2012，28，6：	1
9	A Formal Analysis of Fault Diagnosis with D- Matrices 显示文摘	Sheppard J W Butcher S	2007	Journal of Electronic Testing Theory and Applications2007，，23：	1
10	QCA circuits for robust coplanar crossing显示文摘	BHANJA S OTTAVI M LOMBARDI F	2007	Journal of Electronic Testing2007，23，2：	1
11	Multiple fault detection in two-level multi-output circuits显示文摘	James Jacob Vishwani D. Agrawal	1992	Journal of Electronic Testing1992，，2：	1
12	A new analog circuit fault diagnosis method based on improved mahalanobis distance显示文摘	Han Han Wang Houjun Tian Shulin	2013	Journal of Electron Test2013，29，：	1
13	A Novel test point selection method for analog fault dictionary tech- niques 显示文摘	YANG CH L TIAN SH L LONG B	2010	Journal of Electronic Testing2010，26，5：	1
14	Software and hardware techniques for SEU detection in IP pro- cessors 显示文摘	Bolchini C Miele A Rebaudengo M etc	2008	Journal of Electronic Testing2008，24，1：	1
15	A probabilistic approach to diagnose SETs in sequential circuits显示文摘	Gangadhar S Tragnudas S	2013	Journal of Electronic Testing2013，29，3：	1
16	Modeling and evaluating errors due to random clock shifts in quantum-dot cellular automata circuits显示文摘	KARIM F OTTAVI M HASHEMPOUR H	2009	Journal of Electronic Testing2009，25，1：	1
17	Delay fault testing of look-up tables in SBAM based FPGA 显示文摘	Girard P Hbron O Pravossoudovitch S	2005	Journal of Electronic Testing2005，21，1：	1
18	Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits显示文摘	M. A. El-Gamal M. D. A. Mohamed	2007	Journal of Electronic Testing2007，，4：	1
19	A design based structural test method for a switched resistor DAC显示文摘	MA L GEERT S	2007	Journal of Electronic Testing2007，23，6：	1
20	A class ot two-dimensional cellular automata and their applications in random pattern testing 显示文摘	Chowdhury D R Sengupta I Chaudhuri P P	1994	Journal of Electronic Testing1994，5，：	1

返回顶部每页显示：

共6页首页上一页第1页下一页末页 /6 跳转

互联网出版许可证新出网证(渝)字10号全国400电话 - 免长途话费

用户提示