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21篇 您的检索式：作者名="HAZUCHA P"

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	题名	作者	年代	出处	被引量
1	A rea-efficient linear regulator with ultra-fast load regulation显示文摘	Hazucha P Karnik T Bloechel B A	2005	IEEE Journal of Solid-State Circuits2005，40，4：	1
2	Svensson C: Impact of CMOS technology scaling on the atmospheric neutron soft error rate显示文摘	Hazucha P	2000	IEEE Trans on Nuclear Sc2000，47，6：	1
3	Characterization of soft errors caused by single event upsets in CMOS processes显示文摘	Karnik T Hazucha P Patel J	2004	IEEE Trans on Dependable and Secure Computing2004，1，2：	1
4	Area-efficient linear regulator with ultra-fast load regulation显示文摘	HAZUCHA P KARNIK T BLOECHEL A	2005	IEEE J Sol Sta Circ2005，40，4：	1
5	Impact of CMOS technology scaling on the atmospheric neutron soft error rate显示文摘	HAZUCHA P SVENSSON C	2000	IEEE Transaction on Nuclear Science2000，47，6：	1
6	Area-efficient linear regulator with ultra-fast load regulation显示文摘	Hazucha P Karnik T	2005	IEEE J Sol Sta Circ2005，40，4：	1
7	Area-efficient linear regulator with ultra-fast load regulation显示文摘	P Hazucha T Karmik B A Bloechel C Parsons	2005	IEEE SolidState Circuits2005，40，4：	1
8	Area-efficient linear regulator with ultra-fast load regulator显示文摘	Hazucha P Karnik T Bloechel B A	2005	IEEE J Sol Sta Circ2005，40，4：	1
9	Measurements and analysis of SER-tolerant latch in a 90-nm dual-VT CMOS process显示文摘	Hazucha P Karnik T Walstra S	2004	IEEE Journal of Solid-State Circuits2004，39，：	1
10	Characterization of soft errors caused by single event upsets in CMOS processes 显示文摘	Karnik T Hazucha P Patel J	2004	IEEE Transactions on Dependable and Secure Computing2004，1，2：	1
11	Area-efficient linear regulator with ultra-fast load regulation 显示文摘	HAZUCHA P KARNIK T BORKAR S	2005	IEEE Journal of Solid-State Circuits2005，40，4：	1
12	Area-efficient linear regulator with ultra-fast load regulation 显示文摘	HAZUCHA P KARNIK T BLOECHEL B A	2005	IEEE J Sol Sta Circ2005，40，4：	1
13	A 233-MHz,80%-87% efficient four-phase DC-DC converter utilizing air-core inductors on package显示文摘	Hazucha P Schrom G Jaehong Hahn	2005	IEEE JSSC2005，40，4：	1
14	Impact of CMOS technology scaling on the atmospheric neutron soft error rate 显示文摘	Hazucha P Svensson C	2000	IEEE Trans on Nuclear Science2000，47，6：	1
15	Characterization of soft errors caused by single event upsets in CMOS processes 显示文摘	Karnik T Hazucha P Patel J	2004	IEEE Transactions on Dependable and Secure Computing2004，1，2：	1
16	Characterization o f soft errors caused bysingle event upsets in CMOS processes显示文摘	K am ik T Hazucha P	2004	IEEE Transactionson Dependable and Secure Computing2004，1，2：	1
17	Area-efficient linear regulator with ultra-fast load regulation显示文摘	Hazucha P Kamik T Bloechel B A	2005	IEEE Solid-State Circuits2005，40，4：	1
18	Impact of CMOS Technology Scaling on the Atmospheric Neutron Soft Error Rate显示文摘	Hazucha P Svensson C	2000	IEEE Trans on Nuclear Science2000，47，6：	1
19	Impact of CMOStechnology scaling on the atmospheric neutron soft error rate 显示文摘	HAZUCHA P SVENSSON C	2000	IEEE Trans Nucl Sci2000，47，6：	1
20	Characterization of soft errors caused by single event upsets in CMOS processes 显示文摘	Karnik T Hazucha P Patel J	2004	IEEE Transactions on Dependable and Secure Computing2004，1，2：	1

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