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15篇 您的检索式:作者名="LI BINCHENG"
    题名 作者 年代 出处 被引量
1Optical and photo-carrier characterization of ultra-shallow junctions in silicon显示文摘Spectroscopic ellipsometry (SE), photocarrier radiometry (PCR) and photoluminescence (PL) techniques were employed to measure the ultra-shallow junction (USJ) wafers. These USJ wafers were prepared by As+ ion implantation at energies of 0.5-5 keV, at a dose of 1×1015 As+ /cm 2 and spike annealing. Experimentally the damaged layer of the as-implanted wafer and the recrystallization and activation of the post-annealed wafer were evaluated by SE in the spectral range from 0.27 to 20 m. The PCR amplitude decreased monotonically with the increasing implantation energy. The experimental results also showed that the PCR amplitudes of post-annealed USJ wafers were greatly enhanced, compared to the non-implanted and non-annealed substrate wafer. The PL measurements showed the enhanced PCR signals were attributed to the band-edge emissions of silicon. For explaining the PL enhancement, the electronic transport properties of USJ wafers were extracted via multi-wavelength PCR experiment and fitting. The fitted results showed the decreasing surface recombination velocity and the decreasing diffusion coefficient of the implanted layer contributed to the PCR signal enhancement with the decreasing implantation energy. SE, PCR and PL were proven to be non-destructive metrology tools for characterizing ultra-shallow junctions.HUANG QiuPing LI BinCheng REN ShengDong 2013Science China(Physics,Mechanics & Astronomy)2013,56,7:2
2Simultaneous determination of optical loss, residual reflectance and transmittance of highly anti-reflective coatings with cavity ring down technique显示文摘LI Bincheng CUI Hao HAN Yanling 2014Optics Express(SI094-4087)2014,22,29:1
3Complete Thermal Characterization of Film-on-Substrate System by Modulated Thermoreflectance Microscopy and Multi- parameter Fitting 显示文摘LI Bincheng Pottier L Roger J P 1999J Appl Phys1999,86,5:1
4Photothermal detuning for absorption measurement of optical coatings 显示文摘Hao Honggang Li Bincheng 2008Appl Opt2008,47,2:1
5Amperometric glucose biosensor based on sol -gel organic-inorganic hybrid material显示文摘WANG Bingquan LI Bincheng DENG Qing 1998Anal Chem1998,70,15:1
6Sol - gel thin film immobilized soybean peroxidase biosensor for the amperometric delcrmination of hydrogen peroxide in acid medium显示文摘WANG Bingquan LI Bincheng WANG Zhenxin 1999Anal Chem1999,71,10:1
7Repetition rate dependence of absorption of fused silica irradiated at 193 nm显示文摘Weijing Liu Bincheng Li 2013Chin Opt Lett2013,11,05:1
8Photothermal detuning for absorption measurement of optical coatings 显示文摘HAO HONGGANG LI BINCHENG 2008Applied Opt2008,47,2:1
9Pulsed top-hat beam thermal lens raeasurement on ultraviolet dielectric coatings显示文摘Li Bincheng Martin S Welsch E 1999Opt Lett1999,24,13:1
10Pulsed photothermal deflection with top-hat beam excitation显示文摘Li Bincheng Blaschke H Ristau D 2006J Appl Phys2006,100,05:1
11Probe-beam diffraction in a pulsed top-hat beam thermal lens with a mode-mismatched configuration显示文摘Li Bincheng Welsch E 1999Applied Optics1999,38,24:1
12Pulsed laser induced mode-mismatched crossed-beam thermal lens measurements显示文摘Li Bincheng Zhang S Y Fang J W 1997Rev Sci Instrum1997,68,:1
13Pulsed photothermal deflection with a top-hat beam excitation 显示文摘Li Bincheng Blaschke H Ristau D 2006Journal of Applied Physics2006,100,5:1
14A New computation of Geometric Moments显示文摘Li Bincheng 1993Pattern Recognition1993,26,1:1
15Thermal characterization of film-on-substrate systems with modulated thermoreflectance microscope 显示文摘BINCHENG Li POTTIER L ROGER J P 2000Review of scientific instruments2000,71,5:1
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