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23篇 您的检索式：作者名="OGLETREE D F"

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	题名	作者	年代	出处	被引量
1	Lateral stiffness: a new nanomechanical measurement for the determination of shear strengths with friction force microscopy显示文摘	Carpick R W Ogletree D F Salmeron M	1997	Appl Phys Lett1997，70，12：	1
2	A differentially pumped electrostatic lens system for photoemission studies in the millibar range 显示文摘	Ogletree D F Bluhm H Lebedev G	2002	Review of Scientific Instruments2002，73，：	1
3	Photoelectron spectroscopy under ambient and temperature conditions 显示文摘	Ogletree D F Bluhm H Hebenstreit E B	2009	Nucl Instru Meth2009，601，：	1
4	Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope显示文摘	Carpick R W Agrait N Ogletree D F	1996	J Vac Sci Technol B1996，14，2：	1
5	Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope显示文摘	Carpick R W Agrait N Ogletree D F	1996	J Vac Sci Technol B1996，14，4：	1
6	Imaging thecondensation and evaporation of molecularly thin films of water withnanometer resolution 显示文摘	HU J XIAO X D OGLETREE D F SALMERON M	1995	Science1995，268，：	1
7	High frictional anisotropy of periodic and aperiodic directions on a quasi crystal 显示文摘	Park J Y Ogletree D F Salmeron M	2005	Science2005，309，5739：	1
8	Preparation and characterization of self-assembled monolayers of octadecylamine on mica using hydrophobic solvents 显示文摘	Benitez J J Kopta S Ogletree D F	2002	Langmuir2002，18，16：	1
9	Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope 显示文摘	Carpick R W AgraIt N Ogletree D F	1996	J Vac Sci Technol B1996，14，2：	1
10	Integration of point-contact microscopy and atomic-force microscopy:Application to characterization of graphite/Pt(111) 显示文摘	ENACHESCU M SCHLEEF D OGLETREE D F SALMERON M	1999	PhysicalReview B1999，60，16：	1
11	Calibration of frictional forces in atomic force microscopy显示文摘	Ogletree D F Carpick R W Salmeron M	1996	Rev Sci Instrum1996，67，：	1
12	High frictional anisotropy of periodic and aperiodic directions on a quasicrystal surface显示文摘	Park J Y Ogletree D F Salmeron M	2005	Science2005，309，5739：	1
13	Atomic force microscopy study of beta-substituted-T7 oligothiophene films on mica:Mechanical properties and humidity-dependent phases显示文摘	Chen Jinyu Ratera I Ogletree D F	2005	Langmuir2005，21，3：	1
14	Lateral stiff ness:a new nanomechanical measurement for the de termination of shear strengths with friction force mi croscopy显示文摘	Carpick R W Ogletree D F Salmeron M	1997	Applied Physics Letters1997，70，12：	1
15	Probing the interaction between two single molecules: fluores- cence resonance energy transfer between a single donor and a single acceptor显示文摘	HA T ENDERLE T OGLETREE D F	1996	Proceedings of the National A- cademy of Sciences1996，93，13：	1
16	Probing the interaction between two single molecules:Fluorescence resonance energy transfer between a single donor and a single acceptor显示文摘	Ha T Enderle Th Ogletree D F	1996	Proc Natl Acad Sci USA1996，93，：	1
17	Calibration of frictionalforces in atomic force microscopy显示文摘	Ogletree D F Carpick R W Salmeron M	1996	Review of Scientific Instru-ments1996，67，9：	1
18	LEED intensity analysis of the structures of clean Pt( 111 ) and of OD adsorbed on Pt ( 111 ) in the c(4 × 2) arrangement 显示文摘	OGLETREE D F M A Van Hove SOMORJAI G A	1986	Surf Sci1986，173，：	1
19	Lateral stiff- ness: a new nanomechanical t for the deter- mination of shear strengths with friction force microscopy 显示文摘	Carpick R W Ogletree D F Salmeron M	1997	Applied Physics Letters1997，70，12：	1
20	Imageing the condensation and evaporation of molecularly thin films of water with nanometer resolution显示文摘	J Hu X D Xiao D F Ogletree	1995	Science1995，268，：	1

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