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| 1 | Geometric error measurement and compensation of machines—An update显示文摘 | H. Schwenke W. Knapp H. Haitjema A. Weckenmann R. Schmitt F. Delbressine | 2008 | CIRP Annals - Manufacturing Technology2008，，2： | 3 |
| 2 | CyanoMat-Moderne Cyanident- giftung mittels UV-Oxidation: Anwendungsbeispiele aus der Praxis 显示文摘 | SORENSEN M WECKENMANN J | 2001 | Galvanotechnik2001，92，10： | 1 |
| 3 | Silicon photonics phase and intensity modulators for flat frequency comb generation显示文摘Flat electro-optical frequency combs play an important role in a wide range of applications,such as metrology,spectroscopy,or microwave photonics.As a key technology for the integration of optical circuits,silicon photonics could benefit from on-chip,tunable,flat frequency comb generators.In this article,two different architectures based on silicon modulators are studied for this purpose.They rely on a time to frequency conversion principle to shape the comb envelope.Using a numerical model of the silicon traveling-wave phase modulators,their driving schemes are optimized before their performances are simulated and compared.A total of nine lines could be obtained within a 2 dB flatness,with a line-spacing ranging from 0.1 to 7 GHz.Since this tunability is a major asset of electro-optical frequency combs,the effect of segmenting the phase modulators is finally investigated,showing that the flat lines spacing could be extended up to 39 GHz by this method. | LUCAS DENIEL ERWAN WECKENMANN DIEGO PÉREZ GALACHO CHRISTIAN LAFFORGUE STÉPHANE MONFRAY CARLOS ALONSO-RAMOS LAURENT BRAMERIE FRÉDÉRIC BOEUF LAURENT VIVEN DELPHINE MARRIS-MORINI | 2021 | Photonics Research2021，9，10： | 1 |
| 4 | The Influence of Measurement Strategy on the Uncertainty of CMM Measurements 显示文摘 | Weckenmann A Knauer M | 1998 | CIRP Annals-Manufacturing Technology1998，47，1： | 1 |
| 5 | Uncertainty of Coordinate Measurements on Sheet-metal Parts in The Aulomotive Industry显示文摘 | Weckenmann A Knauer M Killmaier T | 2001 | Journal of Materials Processing Technology2001，115，： | 1 |
| 6 | Probing sys-tems for dimensional micro-and nano-metrology 显示文摘 | WECKENMANN A PEGGS G HOFFMANN J | 2006 | Meas- urement science and Technology2006，17，3： | 1 |
| 7 | Probing systems in dimensional metrology 显示文摘 | WECKENMANN A ESTLER T PEGGS G | 2004 | Annals of the CIRP2004，53，2： | 1 |
| 8 | Manufacturing and measurement of freeform optics显示文摘 | FANG F Z ZHANG X D WECKENMANN A | 2013 | CIRPAnnals-Manufacturing Technology2013，62，2： | 1 |
| 9 | Construction and evaluation of a traceable metrological scanning tunnelling microscope 显示文摘 | Hoffmann J Schuler A Weckenmann A | 2009 | Measurement2009，42，9： | 1 |
| 10 | Probing sys-tems for dimensional micro-and nano-metrology显示文摘 | WECKENMANN A PEGGS G HOFFMANN J | 2006 | MeasurementScinence and Technology2006，17，3： | 1 |
| 11 | Probing systems for dimensional micro- and nano-metrology 显示文摘 | WECKENMANN A PEGGS G HOFFMANN J | 2006 | Measurement Science and Technology2006，17，： | 1 |
| 12 | Measurement uncertainty evaluation of optical multi-sensor-measurements显示文摘 | BERNSTEIN J WECKENMANN A | 2012 | Measurement2012，45，10： | 1 |
| 13 | Optical multi-sensor metrology for extruded profiles显示文摘 | WECKENMANN A BERNSTEIN J | 2010 | Metrology & Measurement Systems2010，17，1： | 1 |
| 14 | Uncertainty of coordinate measurements on sheet-metal parts in the automotive industry显示文摘 | Weckenmann A Knauer M Killmaier T | 2001 | Journal of Materials Technology2001，115，： | 1 |
| 15 | Manufactur- ing and measurement of freeform optics 显示文摘 | Fang F Z Zhang X D Weckenmann A | 2013 | C1RP Annals- Manufacturing Technology2013，62，2： | 1 |
| 16 | Multisensor data fusion in dimensional metrology显示文摘 | WECKENMANN A JIANG X SOMMER KD | | 0，，02： | 1 |
| 17 | Probing systems for dimensional micro- and nano-metrology 显示文摘 | Weckenmann A Peggs G Hoffmann J | 2006 | Measurement Science and Technology2006，17，3： | 1 |
| 18 | Manufacturing and measurement of freeform optics显示文摘 | F.Z. Fang X.D. Zhang A. Weckenmann G.X. Zhang C. Evans | 2013 | CIRP Annals - Manufacturing Technology2013，，： | 1 |
| 19 | The influence of measurement strategy on the uncertainty of CMM-measurements 显示文摘 | Weckenmann A Knauer M | 1998 | Annals of the CIRP1998，47，1： | 1 |
| 20 | Probing systems for dimensional micro and nano-metrology显示文摘 | Weckenmann A Peggs G Hoffmann J | 2006 | Measurement Science and Technology2006，17，3： | 1 |
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